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dc.rights.availabilityUnrestricted.
dc.creatorLin, Youling
dc.date.accessioned2016-11-14T23:15:28Z
dc.date.available2011-02-18T20:12:59Z
dc.date.available2016-11-14T23:15:28Z
dc.date.issued1990-05
dc.identifier.urihttp://hdl.handle.net/2346/13228en_US
dc.description.abstract.
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.subjectSemiconductors -- Inspection -- Data processingen_US
dc.subjectQuality control -- Optical methods -- Data processen_US
dc.subjectOptical data processingen_US
dc.titleTechniques for syntactic analysis of images with application for automatic visual inspection
dc.typeDissertation


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