Techniques for syntactic analysis of images with application for automatic visual inspection
dc.creator | Lin, Youling | |
dc.date.accessioned | 2016-11-14T23:15:28Z | |
dc.date.available | 2011-02-18T20:12:59Z | |
dc.date.available | 2016-11-14T23:15:28Z | |
dc.date.issued | 1990-05 | |
dc.description.abstract | . | |
dc.format.mimetype | application/pdf | |
dc.identifier.uri | http://hdl.handle.net/2346/13228 | en_US |
dc.language.iso | eng | |
dc.publisher | Texas Tech University | en_US |
dc.rights.availability | Unrestricted. | |
dc.subject | Semiconductors -- Inspection -- Data processing | en_US |
dc.subject | Quality control -- Optical methods -- Data process | en_US |
dc.subject | Optical data processing | en_US |
dc.title | Techniques for syntactic analysis of images with application for automatic visual inspection | |
dc.type | Dissertation |