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Home
Federated Electronic Theses and Dissertations
Texas Tech University
Film grain noise limitations in interferometric measurements
Film grain noise limitations in interferometric measurements
Date
1973-05
Authors
De Journett, Stewart Lance
Journal Title
Journal ISSN
Volume Title
Publisher
Texas Tech University
Abstract
Not Available.
Description
Keywords
Electron optics
,
Holography
,
Interference (Light)
,
Electronic noise
Citation
URI
http://hdl.handle.net/2346/11344
Collections
Texas Tech University
Full item page