Film grain noise limitations in interferometric measurements
dc.creator | De Journett, Stewart Lance | |
dc.date.accessioned | 2016-11-14T23:13:35Z | |
dc.date.available | 2011-02-18T19:36:06Z | |
dc.date.available | 2016-11-14T23:13:35Z | |
dc.date.issued | 1973-05 | |
dc.description.abstract | Not Available. | |
dc.format.mimetype | application/pdf | |
dc.identifier.uri | http://hdl.handle.net/2346/11344 | en_US |
dc.language.iso | eng | |
dc.publisher | Texas Tech University | en_US |
dc.rights.availability | Unrestricted. | |
dc.subject | Electron optics | en_US |
dc.subject | Holography | en_US |
dc.subject | Interference (Light) | en_US |
dc.subject | Electronic noise | en_US |
dc.title | Film grain noise limitations in interferometric measurements | |
dc.type | Thesis |