Second harmonic spectroscopy of silicon nanocrystals

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dc.contributor.advisorDowner, Michael Coffinen
dc.creatorFigliozzi, Peter Christopher, 1972-en
dc.date.accessioned2008-08-28T23:53:41Zen
dc.date.accessioned2017-05-11T22:18:40Z
dc.date.available2008-08-28T23:53:41Zen
dc.date.available2017-05-11T22:18:40Z
dc.date.issued2007en
dc.description.abstractUsing a novel two-beam technique developed to greatly enhance quadrupolar contributions to the second-order nonlinear polarization, we performed a nonlinear spectroscopic study of silicon nanocrystals implanted in an SiO₂ matrix.en
dc.description.departmentPhysicsen
dc.format.mediumelectronicen
dc.identifier.oclc191733238en
dc.identifier.urihttp://hdl.handle.net/2152/3531en
dc.language.isoengen
dc.rightsCopyright © is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.en
dc.subject.lcshSilicon crystalsen
dc.subject.lcshSecond harmonic generationen
dc.subject.lcshNanocrystalsen
dc.subject.lcshSilicaen
dc.titleSecond harmonic spectroscopy of silicon nanocrystalsen
dc.type.genreThesisen

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