An approach in IC testing
dc.creator | Mettu, Niranjandas Reddy | |
dc.date.accessioned | 2016-11-14T23:08:26Z | |
dc.date.available | 2011-02-18T22:58:33Z | |
dc.date.available | 2016-11-14T23:08:26Z | |
dc.date.issued | 2003-12 | |
dc.degree.department | Electrical and Computer Engineering | en_US |
dc.description.abstract | Digital testing has revolutionized the semiconductor industry. The demand for quality and reliable product enhanced the testing methods. Testing a device has many challenges. Usage of ATE (Automated Test Equipment) is a big leap in the industry decreasing the time to market pressure and increasing the reliability of the product at various stages [2]. Testing is done at various levels in design and manufacturing to enhance the product quality. An approach is discussed to test any digital IC on any tester using a generic algorithm for DC parametric and loose functional tests. This algorithm can further be extended for AC parametric test and full fledged functional tests according to the ATE capability. | |
dc.format.mimetype | application/pdf | |
dc.identifier.uri | http://hdl.handle.net/2346/19189 | en_US |
dc.language.iso | eng | |
dc.publisher | Texas Tech University | en_US |
dc.rights.availability | Unrestricted. | |
dc.subject | Voltmeters -- Testing | en_US |
dc.subject | Semiconductors -- Testing | en_US |
dc.title | An approach in IC testing | |
dc.type | Thesis |