BIST-based performance characterization of mixed-signal circuits

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dc.contributor.advisorAbraham, Jacob A.en
dc.creatorYu, Hak-soo, 1966-en
dc.date.accessioned2011-08-01T16:20:12Zen
dc.date.accessioned2017-05-11T22:23:00Z
dc.date.available2011-08-01T16:20:12Zen
dc.date.available2017-05-11T22:23:00Z
dc.date.issued2004-08en
dc.descriptiontexten
dc.description.departmentElectrical and Computer Engineeringen
dc.format.mediumelectronicen
dc.identifier.urihttp://hdl.handle.net/2152/12706en
dc.language.isoengen
dc.rightsCopyright is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.en
dc.rights.restrictionRestricteden
dc.subjectMixed signal circuits--Testing--Cost effectivenessen
dc.subjectAutomatic test equipmenten
dc.subjectSignal processing--Digital techniquesen
dc.titleBIST-based performance characterization of mixed-signal circuitsen

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