Reliability characteristics of neural networks having faulty interconnections
dc.creator | Chung, Pau-choo | |
dc.date.accessioned | 2016-11-14T23:14:25Z | |
dc.date.available | 2011-02-18T19:52:20Z | |
dc.date.available | 2016-11-14T23:14:25Z | |
dc.date.issued | 1991-08 | |
dc.description.abstract | Not available | |
dc.format.mimetype | application/pdf | |
dc.identifier.uri | http://hdl.handle.net/2346/12219 | en_US |
dc.language.iso | eng | |
dc.publisher | Texas Tech University | en_US |
dc.rights.availability | Unrestricted. | |
dc.subject | Neural networks (Computer science) -- Testing | en_US |
dc.subject | Fault-tolerant computing | en_US |
dc.title | Reliability characteristics of neural networks having faulty interconnections | |
dc.type | Dissertation |