An impedance bridge for the measurement of the properties of semi-conducting materials

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dc.creatorSlagle, William C
dc.date.accessioned2016-11-14T23:22:54Z
dc.date.available2011-02-18T21:35:46Z
dc.date.available2016-11-14T23:22:54Z
dc.date.issued1952-08
dc.degree.departmentElectrical and Computer Engineeringen_US
dc.description.abstractNot available
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/2346/16522en_US
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.rights.availabilityUnrestricted.
dc.subjectSemiconductorsen_US
dc.subjectElectric engineering -- Materialsen_US
dc.subjectElectric engineeringen_US
dc.titleAn impedance bridge for the measurement of the properties of semi-conducting materials
dc.typeThesis

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