Algorithms for an IIL transistor-level logic simulator

dc.creatorRamesh, Subramanian
dc.date.accessioned2016-11-14T23:08:08Z
dc.date.available2011-02-18T18:58:43Z
dc.date.available2016-11-14T23:08:08Z
dc.date.issued1986-05
dc.degree.departmentComputer Scienceen_US
dc.description.abstractLogic Simulators play an important role in the VLSI design verification process. Integrated Injection Logic circuits have a topology which is different from that of other bipolar technologies such as TTL or ECL. Traditional logic simulators do the simulation at the logic gate level. If these simulators are to be used for IIL circuits, the IIL circuit will have to be converted to an equivalent "normal" form. The proposed work presented here follows a different approach: the circuit is simulated at a transistor level. For every transition that takes place, the time-delays are computed using a simple model. Parasitics and loading effects are included in the time-delay calculation. An existing three-valued simulation algorithm is modified to accommodate the time-delay calculations and the topology of IIL. Finally, the approximations used in the model are evaluated using detailed SPICE simulations.
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/2346/8881en_US
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.rights.availabilityUnrestricted.
dc.subjectAlgorithmsen_US
dc.subjectIntegrated circuits -- Very large scale integrationen_US
dc.subjectIntegrated injection logicen_US
dc.titleAlgorithms for an IIL transistor-level logic simulator
dc.typeThesis

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