Using correlation analysis to identify possible device sensitivities

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dc.creatorOlvera, Juan
dc.date.accessioned2016-11-14T23:36:59Z
dc.date.available2013-01-24T21:29:24Z
dc.date.available2016-11-14T23:36:59Z
dc.date.issued2012-12
dc.description.abstractOne of the semiconductor industry's biggest concerns is yield. Product development engineers have the responsibility of improving yield and must use various tools to ensure that any yield issues are promptly corrected. This study outlines some of the tools that product engineers use, namely that of identifying possible device sensitivities through correlation and regression analysis.
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/2346/47491
dc.language.isoeng
dc.rights.availabilityUnrestricted.
dc.subjectSemiconductors
dc.subjectCorrelation
dc.subjectRegression
dc.subjectProduct development engineering
dc.titleUsing correlation analysis to identify possible device sensitivities
dc.typeThesis

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