Reducing power consumption during online and offline testing

dc.contributor.advisorTouba, Nur A.en
dc.creatorGhosh, Shalinien
dc.date.accessioned2008-08-28T22:06:03Zen
dc.date.accessioned2017-05-11T22:16:32Z
dc.date.available2008-08-28T22:06:03Zen
dc.date.available2017-05-11T22:16:32Z
dc.date.issued2005en
dc.descriptiontexten
dc.description.abstractThis dissertation proposes techniques for power reduction in online and offline circuit testing. Power management is critical in both these domains, since high power dissipation can drive up production cost and even cause errors. The first part of the dissertation focuses on power reduction for online testing with concurrent error detection capabilities, where errors in the operation of the circuit are detected (and possibly corrected) at normal operational run-time. In online testing, power dissipation has lately become a first-order design criterion due to the significant hardware overhead for detecting/correcting errors and ensuring system reliability. Two problems are addressed, namely reducing power in concurrent error detection for (1) error correcting codes for memory checker, and (2) synthesis of parity prediction circuits. The next part of the dissertation discusses power reduction for offline testing. With the advent of high-performance and low-power devices, the power consumed during circuit testing has become a critical issue since the power dissipated in a circuit during the testing phase can be much larger than the power consumed during normal operation. Techniques are presented for reducing power in two popular methods of offline circuit testing: (1) scan testing, and (2) built-in self-test.
dc.description.departmentElectrical and Computer Engineeringen
dc.format.mediumelectronicen
dc.identifierb5983271xen
dc.identifier.oclc61224513en
dc.identifier.proqst3174444en
dc.identifier.urihttp://hdl.handle.net/2152/1550en
dc.language.isoengen
dc.rightsCopyright is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.en
dc.subject.lcshElectronic circuits--Testingen
dc.subject.lcshElectronic circuits--Testing--Cost effectivenessen
dc.subject.lcshElectronic circuit design--Economic aspectsen
dc.titleReducing power consumption during online and offline testingen
dc.type.genreThesisen

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