Study of Borrmann scattering in silicon crystal.
dc.creator | Hwa, Taiann | |
dc.date.accessioned | 2016-11-14T23:26:06Z | |
dc.date.available | 2011-02-18T21:57:11Z | |
dc.date.available | 2016-11-14T23:26:06Z | |
dc.date.issued | 1975-05 | |
dc.degree.department | Physics | en_US |
dc.description.abstract | Not available | |
dc.format.mimetype | application/pdf | |
dc.identifier.uri | http://hdl.handle.net/2346/17263 | en_US |
dc.language.iso | eng | |
dc.publisher | Texas Tech University | en_US |
dc.rights.availability | Unrestricted. | |
dc.subject | X-rays -- Diffraction | en_US |
dc.subject | Silicon crystals | en_US |
dc.subject | Scattering (Physics) | en_US |
dc.title | Study of Borrmann scattering in silicon crystal. | |
dc.type | Thesis |