Silicon Nanocrystals and Defect States in Silicon Rich Silicon Nitride for Optoelectronic Applications
dc.contributor | Cogan, Stuart F | |
dc.date.accessioned | 2017-01-24T16:37:30Z | |
dc.date.accessioned | 2018-02-16T18:48:30Z | |
dc.date.available | 2017-01-24T16:37:30Z | |
dc.date.available | 2018-02-16T18:48:30Z | |
dc.date.created | 2017-01-24T16:37:30Z | |
dc.date.issued | 2016-12 | |
dc.description.abstract | ||
dc.identifier | http://hdl.handle.net/10735.1/5226 | |
dc.identifier.uri | http://hdl.handle.net/10735.1/5226 | |
dc.language | en | |
dc.subject | Silicon | |
dc.subject | Silicon nitride | |
dc.subject | Quantum dots | |
dc.subject | Nanocrystals | |
dc.subject | Silicon carbide | |
dc.subject | Oxidation | |
dc.subject | Defect states | |
dc.subject | Stress | |
dc.title | Silicon Nanocrystals and Defect States in Silicon Rich Silicon Nitride for Optoelectronic Applications | |
dc.type | Dissertation |