Accelerated testing of a lanthanum-modified lead zirconate titanate capacitor
| dc.contributor.committeeChair | Gale, Richard O. | |
| dc.contributor.committeeMember | Cox, Ronald H. | |
| dc.creator | Smith, Cartel | |
| dc.date.accessioned | 2016-11-14T23:11:54Z | |
| dc.date.available | 2012-03-05T15:16:08Z | |
| dc.date.available | 2016-11-14T23:11:54Z | |
| dc.date.issued | 2011-12 | |
| dc.degree.department | Electrical and Computer Engineering | en_US |
| dc.description.abstract | This literature begins by introducing the history of reliability and safety engineering. From here, a statistical foundation is laid with an emphasis on the distribution functions that are often associated with this branch of engineering- specifically as it pertains to semiconductor reliability evaluation. This thesis then goes on to examine the more interesting properties of the PLZT material. A broad discussion of the processing flow of a capacitor that utilizes the PLZT dielectric follows. The text then transitions to a reliability analysis of the aforementioned capacitor. Here, thorough descriptions of all accelerated tests are given-including hardware setups. Later, the results of the tests are presented. Finally, this text concludes with a theoretical interpretation of the results from a reliability perspective; whereby modeling data and acceleration factors are discussed, and an example is given. | |
| dc.format.mimetype | application/pdf | |
| dc.identifier.uri | http://hdl.handle.net/2346/23880 | en_US |
| dc.language.iso | eng | |
| dc.rights.availability | Restricted - embargoed from online display. For access, please contact the author. | |
| dc.subject | Semiconductor reliability | en_US |
| dc.subject | Accelerated testing | en_US |
| dc.subject | Wafer level reliability | en_US |
| dc.title | Accelerated testing of a lanthanum-modified lead zirconate titanate capacitor | |
| dc.type | Thesis |