Automation of testing for current limits and serial peripheral interfaces with 10ns timing resolution



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Conventional bench testing can be a costly and slow method of validating a device. Complications from test setups and changes in equipment can also contribute to frustrations. Automation of this process can increase the capacity of the testing lab as well as decrease mistakes and costs. It is hoped that a simple testing procedure can be automated in order to lower the effects of testing mistakes and eliminate the need for changes in equipment. LabVIEW is an excellent way to collect, process, and send data while another system will be needed for a high-speed chip interface.