Artificial testing for high power switches

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dc.creatorCavazos, Thomas C
dc.date.accessioned2016-11-14T23:26:00Z
dc.date.available2011-02-18T21:56:48Z
dc.date.available2016-11-14T23:26:00Z
dc.date.issued1989-05
dc.degree.departmentElectrical and Computer Engineeringen_US
dc.description.abstractNot available
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/2346/17250en_US
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.rights.availabilityUnrestricted.
dc.subjectSemiconductor switches -- Testingen_US
dc.subjectCapacitors -- Testingen_US
dc.subjectPulse circuits -- Testingen_US
dc.titleArtificial testing for high power switches
dc.typeThesis

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