The analysis of the steady-state thermal and electrical behavior of a silicon metal-oxide-semiconductor field effect transistor.

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dc.creatorAkers, Lex A.
dc.date.accessioned2016-11-14T23:12:09Z
dc.date.available2011-02-18T19:08:50Z
dc.date.available2016-11-14T23:12:09Z
dc.date.issued1975-08
dc.degree.departmentAccounting and Information Systemsen_US
dc.description.abstract.
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/2346/9611en_US
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.rights.availabilityUnrestricted.
dc.subjectSemiconductorsen_US
dc.subjectField-effect transistorsen_US
dc.subjectElectric currentsen_US
dc.titleThe analysis of the steady-state thermal and electrical behavior of a silicon metal-oxide-semiconductor field effect transistor.
dc.typeDissertation

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