Browsing by Subject "MFM"
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Item Design and construction of a magnetic force microscope(Texas A&M University, 2005-08-29) Khandekar, Sameer SudhakarA magnetic force microscope (MFM) is a special type of scanning force microscope which measures the stray field above a ferromagnetic sample with the help of a ferromagnetic cantilever. The aim of this project was to design and build a MFM head and interface it with a commercial scanning probe electronics controller with the help of an appropriate force sensor. The MFM head and the force sensor were to be designed to work at low temperatures (down to 4 K) and in high vacuum. During this work, a magnetic force microscope (MFM) head was designed. Its design is symmetrical and modular. Two dimensional views were prepared to ensure proper geometry and alignment for the various modules. Based on these views, individual parts in the various modules were manufactured and combined for the final assembly of the head. This MFM head has many essential and advanced features which were incorporated during the design process. Our MFM head has an outside diameter of 5 cm and thus has a low thermal mass. The head operates inside a 100 cm long vacuum can which is kept in a cold bath inside a superinsulated dewar. Other features of this MFM head include thermal compensation of the important parts, flexibility to use commercial MFM cantilevers and a large scan range compared to the previous designs. Some of the anticipated system specifications are: 1) room temperature scanning range of 175?? 175 ??m, 2) low temperature scanning range between 35-50 ??m, 3) smallest detectable magnetic force in the range of one pN and 4) smallest detectable magnetic force gradient in the range of 10-3 to 10 -5 N/m. This MFM head was interfaced to a commercial scanning probe electronics apparatus by designing a fiber-optic interferometer as the sensor for the detection of the cantilever deflection. The fiber-optic sensor also has features of its own such as stability, compactness and low susceptibility to noise because of all-fiber construction. With this MFM head, we hope to image many magnetic samples which were previously impossible to image at Texas A&M.Item Exploration of voltage controlled manganite phase transitions as probed with magnetic force microscopy(2010-05) Ruzicka, Frank Joseph; de Lozanne, Alejandro L.; Tsoi, Maxim; Shih, Chih-Kang; Markert, John T.; Shi, LiLow-temperature magnetic force microscopy was used to study the phase diagram of a La1/3Pr1/3Ca1/3MnO3 thin film grown on a (110) NdGaO3 (NGO) substrate by pulsed laser deposition. Traditionally, one can observe the phase change at the nanoscale level as the sample is cooled from room temperature through the transition temperature to liquid nitrogen temperatures, but in this case a fixed voltage ranging from 0 V to 31 V was applied before each cooling cycle. From in and ex situ transport measurements, it is observed that the temperature of the peak of the transition increases with applied field; however, the MFM images show that the magnetic transition begins at a lower temperature with the same increase in field. Thus, this dissertation shows that a new voltage control exists for the phase transition in certain manganites.Item Low temperature magnetic structure studies of La₂₋₂xSr₁₊₂xMn₂O₇ using scanning probe microscopy(2013-12) León Brita, Neliza; de Lozanne, Alejandro L.The high degree of modification through chemical substitution afforded by the perovskite crystal structure and its related counterparts allows a systematic study of structure-property relationships critical to understand the wide variety of exotic phenomena observed in these materials where the spin, charge, orbital, and lattice degrees of freedom are highly correlated. From the multiple phenomena observed in these materials, which includes multiferroicity, catalytic activity, and high temperature superconductivity, this study is concerned with a material that displays colossal magnetoresistance (CMR), La₂₋₂xSr₁₊₂xMn₂O₇; this is a naturally bilayered manganite that exhibits CMR at a paramagnetic to ferromagnetic transition that coincides with an insulator to metal transition. The strong correlation between different degrees of freedom in the material leads to considerable variation in its magnetic properties due to doping even in the small range studied of 0.32 [less than or equal to] x [less than or equal to] 0.4, where the easy axis of magnetization changes from the c-axis to the ab plane. Magnetic force microscopy (MFM) was used for this part of the work, to visualize the local variation of the out of plane (c-axis) magnetization or magnetic microstructure of La₂₋₂xSr₁₊₂xMn₂O₇ for 0.32 [less than or equal to] x [less than or equal to] 0.4 at the exposed ab surface and its evolution due to an applied magnetic field at 4 K. For the x = 0.32 composition, which is close to the out of plane to in plane magnetization transition, a strong preferred magnetization direction within the ab plane or magnetocrystalline anisotropy was observed. The stray magnetic field of the MFM tip perturbs the magnetic microstructure of low coercivity materials like diluted magnetic semiconductors, making it unsuitable for the study of such materials. For this reason, as part of this project a scanning Hall probe microscope (SHPM), a magnetic imaging technique complementary to MFM that uses a Hall sensor that provides a magnetically non-invasive calibrated measurement of the stray fields at the surface of a sample with good resolution (~ 1 [micrometer]), was designed. The construction of a compact cryogenic variable-temperature (77 - 300 K) SHPM, highlighting its features, is described.