Browsing by Subject "Level-crossing spectroscopy"
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Item Deep level transient spectroscopy and uniaxial stress system(Texas Tech University, 1990-12) Yang, ShilianDeep level transient spectroscopy (DLTS) combined with uniaxial stress will not only determine the energy level of a defect center in semiconductor but also tell its symmetry, which is very important for identifying the structure of a defect center. As a thesis for my Master's of Science Degree, this report explains the theories of DLTS and uniaxial stress, our experimental system and some initial results obtained from this system.