Browsing by Subject "Analog-to-digital converter"
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Item An Energy Efficient Asynchronous Time-Domain Comparator(2013-04-26) Gao, YangIn energy-limited applications, such as wearable battery powered systems and implantable circuits for biological applications, ultra-low power analog-to-digital converters (ADCs) are essential for sustaining long time operation. As a fundamental building block of ADC, comparator should support a tightened power budget. Therefore, developing low-power design techniques for comparator is becoming more and more important. As an alternative to the conventional voltage-mode comparator, this thesis proposed an energy efficient time-domain comparator, which uses digital circuits to process analog signals by representing them as timing information. The proposed time-domain comparator has three main features: comparing on both clock edges (rising/falling), asynchronous comparison and 2-bit/step comparison. With these features, power consumption of the comparator can be effectively reduced. For verification, the proposed time-domain comparator is fabricated in IBM 0.18um CMOS technology in comparison with other two conventional time-domain comparators working at 100kS/s sampling rate and 8-bit resolution. The achieved power consumption of the proposed time-domain comparator is 50nW, which is much lower than 84nW and 285nW of the other two time-domain comparators.Item Design techniques for low-power SAR ADCs in nano-scale CMOS technologies(2016-05) Chen, Long; Sun, Nan; Viswanathan, T.R.; Pan, David Z.; Orshansky, Michael; Soenen, EricThis thesis presents low power design techniques for successive approximation register (SAR) analog-to-digital converters (ADCs) in nano-scale CMOS technologies. Low power SAR ADCs face two major challenges especially at high resolutions: (1) increased comparator power to suppress the noise, and (2) increased DAC switching energy due to the large DAC size. To improve the comparator’s power efficiency, a statistical estimation based comparator noise reduction technique is presented. It allows a low power and noisy comparator to achieve high signal-to-noise ratio (SNR) by estimating the conversion residue. A first prototype ADC in 65nm CMOS has been developed to validate the proposed noise reduction technique. It achieves 4.5 fJ/conv-step Walden figure of merit and 64.5 dB signal-to-noise and distortion ratio (SNDR). In addition, a bidirectional single-side switching technique is developed to reduce the DAC switching power. It can reduce the DAC switching power and the total number of unit capacitors by 86% and 75%, respectively. A second prototype ADC with the proposed switching technique is designed and fabricated in 180nm CMOS technology. It achieves an SNDR of 63.4 dB and consumes only 24 Wat 1MS/s, leading to aWalden figure of merit of 19.9 fJ/conv-step. This thesis also presents an improved loop-unrolled SAR ADC, which works at high frequency with reduced SAR logic power and delay. It employs the bidirectional single-side switching technique to reduce the comparator common-mode voltage variation. In addition, it uses a Vcm-adaptive offset calibration technique which can accurately calibrate comparator’s offset at its operating Vcm. A prototype ADC designed in 40nm CMOS achieves 35 dB at 700 MS/s sampling rate and consumes only 0.95 mW, leading to a Walden figure of merit of 30 fJ/conv-step.Item Digital enhancement techniques for data converters in scaled CMOS technologies(2015-12) Sanyal, Arindam; Sun, Nan; Viswanathan, TR; Orshansky, Michael; Hall, Neal; Yan, ShouliThis thesis presents digital enhancement techniques for data converters in advanced technology nodes. With technology scaling, traditional voltage-domain (VD) analog-to-digital converters (ADCs) face two major challenges: (1) reduction of dynamic range due to supply voltage scaling, and (2) decrease in intrinsic gain of transistors which makes high gain amplifier design tough. To address these challenges, a two-stage ADC architecture is presented which uses time-domain quantization to exploit the advantages of technology scaling. The architecture, consisting of a first stage successive approximation register (SAR) and a second stage ring oscillator, is highly digital and scaling friendly. Two prototypes have been developed to validate the proposed architecture. The 40nm CMOS prototype achieves 75.7 dB dynamic range at an excellent Schreier figure-of-merit of 172.2 dB. The proposed architecture has been extended to a capacitance-to-digital converter and a prototype has been developed in 40nm CMOS. The prototype can sense capacitances with a resolution of 1.3fF and has a Walden figure-of-merit of 60 fJ/step which is more than two times better than the current state-of-the-art. This thesis also presents digital techniques to improve performance of continuous-time(CT), delta-sigma digital-to-analog converters (DACs). Recently, CT delta-sigma DACs have received more attention than their discrete, switched-capacitor counterpart mainly because of low power and/or higher speed of operation. However, a critical disadvantage of CT, delta-sigma DACs is their greatly increased sensitivity to inter-symbol interference (ISI) error. To address this shortcoming of CT DACs, this thesis presents several algorithms that can mitigate ISI error simultaneously with static mismatch error. Further, the proposed algorithms are fully digital in nature and as such, are best poised to take maximum advantage of technology scaling. Thus, the techniques presented in this thesis will be important enabling factors in raising the envelope of performance of CT delta-sigma DACs in advanced technology nodes.Item Time-based oversampled analog-to-digital converters in nano-scale integrated circuits(2014-12) Jung, Woo Young; Hassibi, ArjangIn this research, a time-based oversampling delta-sigma (ΔΣ) ADC architecture is introduced. This system uses time, rather than voltage or current, as the analog variable for its quantizer, and the noise shaping process is realized by modulating the width of a variable-width digital “pulse.” The ΔΣ loop integrator, the quantizer and digital-to-analog converter (DAC) are all time-based circuits and are implemented using digital gates only. Hence, no amplifier or voltage-based circuit is required. The proposed architecture not only offers a viable for nano-scale ‘digital’ IC technologies, but also enables improved circuit performance compared to the state-of-the-art. This is in contrast to conventional voltage-based analog circuit design, whose performance decreases with scaling due to increasingly higher voltage uncertainty due to supply voltage. The proposed architecture allows all digital implementation after the Voltage to Time Converter (VTC) and merged multi-bit quantizer/DAC blocks by taking advantage of delay lines reusable in both quantization and DAC operation. The novelty of this architecture is digital pulse width processing to implement the ΔΣ modulation. It is realized with small area and potentially can take advantage from the process scaling. A 3-bit prototype of this ADC in 0.18 μm CMOS process is implemented, tested, and presented. With an OSR of 36 and a bandwidth of 2 MHz, it achieves a SNDR of 34.6 dB while consuming 1.5 mA from a 1.8 V supply. The core occupies an area of 0.0275 mm² (110μm × 250μm = 0.0275 mm²). The second generation of the architecture was fabricated in IBM 45 nm SOI process. The oversampling frequency of this system is 705 MHz and oversampling ratio of 64. The expected performance is 7-bit effective resolution for a 5.5 MHz bandwidth while consuming 8mW of power and occupying a core area of less than 0.02 mm² (160μm × 120μm = 0.0192 mm²).Item Yield improvement for analog to digital converter test(2007-05) Kamalapuri, Poorvaja; Parten, Michael E.; Nutter, Brian; Gale, Richard O.A yield of 99% is a very demanding yet achievable target in the semiconductor industry. High volumes and fierce competition call for constant yield management. Continual monitoring of trends and process improvements aim to achieve such high yields. This thesis outlines a systematic approach to problem solving intended to serve as a guide to diagnose and solve yield issues. It also helps identify dead-ends to make pragmatic decisions in view of return on investment. An example problem of yield loss of an Analog to Digital Converter test is discussed to illustrate the procedure. Further, the steps taken to bring its yield up to a satisfying figure are explained.