Study of metal films by the method of total reflection of x-rays

Unrestricted.2016-11-142011-02-182016-11-141980-05http://hdl.handle.net/2346/17946Not availableapplication/pdfengX-rays -- ScatteringMetallic films -- Optical propertiesReflection (Optics)Study of metal films by the method of total reflection of x-raysDissertation