Scan test data compression using alternate Huffman coding

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2012-05

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Abstract

Huffman coding is a good method for statistically compressing test data with high compression rates. Unfortunately, the on-­‐chip decoder to decompress that encoded test data after it is loaded onto the chip may be too complex. With limited die area, the decoder complexity becomes a drawback. This makes Huffman coding not ideal for use in scan data compression. Selectively encoding test data using Huffman coding can provide similarly high compression rates while reducing the complexity of the decoder. A smaller and less complex decoder makes Alternate Huffman Coding a viable option for compressing and decompressing scan test data.

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