X-ray line width measurements with a three-crystal spectrometer

dc.creatorWelch, Herbert Eugene
dc.date.accessioned2016-11-14T23:07:35Z
dc.date.available2011-02-18T22:24:18Z
dc.date.available2016-11-14T23:07:35Z
dc.date.issued1969-05
dc.degree.departmentPhysicsen_US
dc.description.abstractNot available
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/2346/18145en_US
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.rights.availabilityUnrestricted.
dc.subjectSpectrometeren_US
dc.subjectX-ray crystallographyen_US
dc.titleX-ray line width measurements with a three-crystal spectrometer
dc.typeDissertation

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