Outlier model using fmax to predict failing devices

dc.contributor.committeeChairParten, Michael E.
dc.contributor.committeeMemberCox, Ronald H.
dc.creatorPharis, Jason A.
dc.date.accessioned2016-11-14T23:09:04Z
dc.date.available2011-02-18T23:25:02Z
dc.date.available2016-11-14T23:09:04Z
dc.date.issued2005-08
dc.degree.departmentElectrical and Computer Engineeringen_US
dc.description.abstractIn the fabrication and manufacturing of Very Large Scale Integrated Circuits (VLSI) it is needed to continually seek out new methods to reducing the cost associated with testing and insuring reliability. Using the measured maximum operating frequency of a device compared to the population that the device came from outliers can be identified. Analysis of the characteristics of these outliers predict defective units from other populations by measuring the maximum operating frequency.
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/2346/19953en_US
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.rights.availabilityUnrestricted.
dc.subjectBurn-inen_US
dc.subjectOutlier modelen_US
dc.subjectReliabilityen_US
dc.subjectSemiconductoren_US
dc.titleOutlier model using fmax to predict failing devices
dc.typeThesis

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