Developing a test solution at wafer probe
Date
2001-12
Authors
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Publisher
Texas Tech University
Abstract
This thesis is organized to explain how testers function, testing methodology, test program conversion and the incorporation of BIST in devices. Chapter II defines the problem and goal of the project. Chapter III delves into tester hardware and architecture. Chapter IV discusses testing methodologies and individual test procedures. Chapter V talks about BIST and applications. Chapter VI presents results with some concluding remarks in Chapter VII.