Removal of Kelvin Contactor with soft compensation

In production testing of semiconductor devices contact resistance can be significant between the output of the tester and the device pin. At each insertion of the device, the contact resistance changes which causes failure at the production level. Thus the purpose of this project is to calculate the contact resistance at the output of the tester and compensate at the specified pin. This idea also leads to the elimination of Kelvin contactors for small packages such as micro-QFN or sub 1x1mm packages to reduce the crowding of contactor pins on the device pads. This project will describe the ways of calculating the contact resistance using the ESD structure and also how to compensate for some of the critical test using this IR drop.