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    Using correlation analysis to identify possible device sensitivities

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    Date
    2012-12
    Author
    Olvera, Juan
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    Abstract
    One of the semiconductor industry's biggest concerns is yield. Product development engineers have the responsibility of improving yield and must use various tools to ensure that any yield issues are promptly corrected. This study outlines some of the tools that product engineers use, namely that of identifying possible device sensitivities through correlation and regression analysis.
    URI
    http://hdl.handle.net/2346/47491
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