Automated bench setup to characterize and test integrated circuits efficiently

Date

2006-09

Journal Title

Journal ISSN

Volume Title

Publisher

Texas Tech University

Abstract

Discusses the importance of testing of integrated circuits and different testing techniques. The creation of the automated bench test setup is shown and the process to create on discussed. A specific part is picked to demonstrate an automated bench tester. The test setup, generation of the test signals, the programs required to automate the equipment, and the results are presented. LabVIEW is used to control and automate the test setup. It is an excellent at collecting, processing, and sending data.

Description

Citation