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dc.degree.departmentElectrical and Computer Engineeringen_US
dc.rights.availabilityUnrestricted.
dc.creatorSen, Neeraj
dc.date.accessioned2016-11-14T23:15:27Z
dc.date.available2011-02-18T20:12:30Z
dc.date.available2016-11-14T23:15:27Z
dc.date.issued1977-12
dc.identifier.urihttp://hdl.handle.net/2346/13204en_US
dc.description.abstractNot available
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.subjectElectronic analog computers -- Testingen_US
dc.subjectElectric fault locationen_US
dc.titleA measure of testability and its application to test point selection
dc.typeThesis


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