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dc.contributor.advisorNeikirk, Dean P., 1957-en
dc.contributor.committeeMemberDodabalapur, Ananthen
dc.creatorZhang, Sheng, 1986-en
dc.date.accessioned2010-10-26T21:39:43Zen
dc.date.accessioned2010-10-26T21:39:51Zen
dc.date.accessioned2017-05-11T22:20:30Z
dc.date.available2010-10-26T21:39:43Zen
dc.date.available2010-10-26T21:39:51Zen
dc.date.available2017-05-11T22:20:30Z
dc.date.issued2010-05en
dc.date.submittedMay 2010en
dc.identifier.urihttp://hdl.handle.net/2152/ETD-UT-2010-05-1142en
dc.descriptiontexten
dc.description.abstractThe objective of this thesis is to develop a complex dielectric properties sensor using interdigitated capacitor (IDC) structure. IDCs are easy to fabricate and because of its planar structure, it can be easily integrated with other sensing components and signal processing electronics. The design, fabrication, modeling, and testing of IDC sensors are presented in this thesis. Design parameters and their influence on sensor's output signals are discussed. Previous IDC models are reviewed and the limitations are studied. A new equivalent circuit model based on the fringing electric field distribution and a novel iterative data extraction algorithm combining Finite-Element Method (FEM) and the equivalent circuit model is studied. Results suggest that the algorithm can accurately extract relatively low dielectric constant and conductivity of material under test (MUT) from measured impedance data.en
dc.format.mimetypeapplication/pdfen
dc.language.isoengen
dc.subjectDielectric constanten
dc.subjectIDCen
dc.subjectInterdigitated capacitoren
dc.subjectConformal mappingen
dc.subjectSensoren
dc.titleInterdigitated capacitor sensor for complex dielectric constant sensingen
dc.type.genrethesisen
dc.date.updated2010-10-26T21:39:51Zen


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