A random jitter RMS measurement method using AND and OR operations
Lee, Jae Wook, 1972-
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Jitter is defined as timing uncertainties of digital signals at their intended ideal positions in time. While it undermines valuable clock budget and limits the maximum clock frequency in I/O circuitry, it is one of the most difficult parameters to measure accurately due to the small value and randomness. This thesis proposes a random jitter RMS measurement method using AND and OR operations, which targets BIST applications. This thesis is organized as follows. Chapter 1 introduces the motivation of the proposed work. It includes a comparison between two major approaches to jitter measurement. Chapter 2 explains the proposed random jitter estimation method in detail. Chapter 3 describes circuit implementations with design considerations. Chapter 4 demonstrates estimation results from circuit level simulation runs. Chapter 5 discusses the source of error in the jitter estimation and concludes.