|dc.contributor.advisor||Abraham, Jacob A.||en
|dc.description.abstract||With aggressive technology scaling, within-die random variations are becoming the
most dominant source of process variations. Gate-level statistical static timing is becoming
a widely accepted approach as an alternative to static timing analysis. However, statistical
timing approaches lack good models for handling timing variations due to within-die random
variations. Before performing statistical timing analysis on a design or System On Chip
(SoC), the cells in the library are pre-characterized for delay as well as constraints due to
these random variations. This is referred to as statistical characterization of the cells. The
major contribution of this dissertation is the development of novel techniques for statistical
characterization and optimization of cells. The methods couple the knowledge of circuits
along with the significant factor analysis methods to compute the sensitivities, to perform
statistical timing and to perform sensitivity-aware cell optimizations.
The first contribution of this dissertation is a statistical delay characterization
method developed for computing delay sensitivities of standard cells considering both global
and mismatch process variations. In addition to the cells being characterized for delay, the sequential cells are characterized for timing constraints like setup and hold time constraints.
The second contribution of this dissertation addresses the problem of constraint sensitivity
characterization in sequential cells.
Block-based statistical timing approaches lack accurate consideration of the impact
of slew variations on both delay and arrival time variations. Specifically, the delay variations
due to within-die random variables (mismatch variables) result in a slew-based correlation
during timing propagation. Handling within-die random variations more accurately during
statistical timing propagation is the topic of the third contribution of this dissertation.
Clock networks are more prone to these within-die random variations and can result in significant
clock-skew variations. In the fourth contribution, a timing margining methodology
is presented that accurately accounts for the clock skew variations in a timing sign-off flow.
Typically, the standard cells are designed very early in the design cycle and long before
the process reaches production maturity. Any subtle improvements to reduce variability
in standard cells can improve parametric yield significantly. Statistical characterization of
cells for timing provides a key baseline for understanding the circuit behavior due to different
sources of variation. The sensitivity information can also help increase yield by reducing
the variability during the circuit design itself. The final contribution in the dissertation addresses
this by defining key cell and device criticality metrics. A sensitivity-aware standard
cell layout optimization is demonstrated using the proposed criticality metrics.||en
|dc.rights||Copyright is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.||en
|dc.subject||Optimization of cells||en
|dc.title||Statistical characterization for timing sign-off : from silicon to design and back to silicon||en
|dc.description.department||Electrical and Computer Engineering||en