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dc.contributor.advisorShih, Chih-kangen
dc.identifier.oclc67120225en
dc.creatorEom, Daejinen
dc.date.accessioned2008-08-28T22:22:48Zen
dc.date.accessioned2017-05-11T22:16:48Z
dc.date.available2008-08-28T22:22:48Zen
dc.date.available2017-05-11T22:16:48Z
dc.date.issued2005en
dc.identifierb60728553en
dc.identifier.urihttp://hdl.handle.net/2152/1901en
dc.descriptiontexten
dc.format.mediumelectronicen
dc.language.isoengen
dc.rightsCopyright is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.en
dc.subject.lcshThin filmsen
dc.subject.lcshMetallic filmsen
dc.subject.lcshSemiconductorsen
dc.titleLow temperature scanning tunneling microscope study of metallic thin films on the semiconductor substratesen
dc.description.departmentPhysicsen
dc.type.genreThesisen


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