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dc.contributorCogan, Stuart F
dc.date.accessioned2017-01-24T16:37:30Z
dc.date.accessioned2018-02-16T18:48:30Z
dc.date.available2017-01-24T16:37:30Z
dc.date.available2018-02-16T18:48:30Z
dc.date.created2017-01-24T16:37:30Z
dc.date.issued2016-12
dc.identifierhttp://hdl.handle.net/10735.1/5226
dc.identifier.urihttp://hdl.handle.net/10735.1/5226
dc.description.abstract
dc.languageen
dc.subjectSilicon
dc.subjectSilicon nitride
dc.subjectQuantum dots
dc.subjectNanocrystals
dc.subjectSilicon carbide
dc.subjectOxidation
dc.subjectDefect states
dc.subjectStress
dc.titleSilicon Nanocrystals and Defect States in Silicon Rich Silicon Nitride for Optoelectronic Applications
dc.typeDissertation


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